Farfield AnaLight® Systems for Surface Science and Nanotechnology

AnaLight® Systems for Surface Science bring Farfield's revolutionary Dual Polarisation Interferometry (DPI) technology into instrument formats to suit a range of surface science and thin film applications in basic research and industrial product development.

AnaLight® gives surface science, thin film and surface science structural and behavioural measurements in a convenient benchtop package:

• Dynamic, high-resolution characterisation of thin films and nanosurfaces revealing interfacial mass and structural changes in real time
• Measure film thickness, optical density (RI) and mass loading simultaneously
• Data analysis with minimal assumptions and no modelling
• Dynamic structural behaviour of polymers, surfactants and biomaterials (soft surfaces)
• Quantitative analysis of molecular adsorption, absorption and desorption processes as they happen
• Nearfield technique enables study of turbid and scattering systems without compromise

For full information on AnaLight® surface science instruments click on your product of choice below:

AnaLight®4D

"A new insight into the analysis of biological surfaces"

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AnaLight® Nano200

"Convenient, Parallel Nanosurface Structure and Behaviour Analysis"

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AnaLight® NanoFlex

"Automated, Quantitative Thin Film and Nanosurface Characterisation"

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AnaLight® surface science instruments routinely and reproducibly provide quantitative data on real-time changes in dimension (resolution <0.1Å) and density (resolution <0.1 picogram/mm2) of immobilised and interacting thin films and nanosurfaces in the 0.1nm to 100nm range. This allows accurate calculation of further parameters including mass, surface coverage and concentration.